ImageJ - Scanning Electron Microscope (SEM) (Advanced) - Particle Size Analysis | AMC-Tec | #002

Описание

Scanning Electron Microscope (SEM) Image Analysis (Advanced) - Particle Size Analysis using the Threshold function of ImageJ software.

AMC-Tec | Video #002

Key point
* Setting up the scale
* Use of Analyse particle function
* Use of Threshold to distinguish particles
* Use of FFT Bandpass filter
* How to select optimum threshold value

ImageJ software
https://drive.google.com/file/d/1p4aweoils-CX85WbCNaMBEiXamRKPu54/view?usp=sharing
SEM Examples
https://drive.google.com/file/d/1xuiLrswmiiuEGWCkiTwN_9aF_RnJY--_/view?usp=sharing

ResearchGate: https://www.researchgate.net/profile/Isuru_Lakmal
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Advanced Materials Research Laboratory
Department of Physics
Faculty of Science
University of Peradeniya
Sri Lanka